发明名称 DEFECT INSPECITION DEVECE FOR LENTICULAR LENS SHEET
摘要 PURPOSE: To provide an automatic inspection device which can cope with the warpage of lenticular lens sheet. CONSTITUTION: The defect inspection device is provided with one or a plurality of linear region image pick-up means 110 for picking up the image of a specific linear region of a lenticular sheet straddling over the width in the direction nearly a right angle to the traveling direction of at least a sheet of plate of or continuous plate-shaped lenticular lens sheet 150 by a reflection dark field light, a lighting means 120 for supplying the reflection dark field lighting for picking up image for the linear region image pickup means, and an image processing means 130 for detecting a defect based on the image data obtained by the linear region image processing means. The defect inspection device for detecting the defect of the lentcular lens sheet while moving the lenticular lens sheet at a certain speed is provided with a calibration means 140 for calibrating the warpage of the lenticulation lens to be inspected at least near an image pickup visual field.
申请公布号 JPH08178864(A) 申请公布日期 1996.07.12
申请号 JP19940336594 申请日期 1994.12.26
申请人 DAINIPPON PRINTING CO LTD 发明人 HASEGAWA JUN;NAKANISHI MINORU
分类号 G01N21/88;G01N21/89;G01N21/892;G01N21/896;G03B21/62;G06T1/00;G06T7/00 主分类号 G01N21/88
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