| 摘要 |
<p>PURPOSE: To obtain a highly reliable semiconductor acceleration detector which can detect the abnormality of an output amplification circuit when a detector is diagnosed by apply a dummy acceleration. CONSTITUTION: The semiconductor acceleration detector is provided with a bridge circuit consisting of strain gage resistances 1 to 4, first and second calculation amplifiers 5 and 6 in which non-inversion input terminals are respectively connected with the first and second output terminals thereof and the output terminal and non-inversion terminal are connected with each other through a feedback resistance, and an output amplification circuit having a third calculation amplifier 7 in which the output terminals of the first and second amplifiers are respectively connected with an inversion input terminal and non-inversion input terminal through a resistance and an output terminal and inversion input terminal are connected with each other through a feedback resistance, further an offset voltage is applied to the non-inversion input terminal by resistance potential division. In addition, first and second constant current sources 16 and 17 are provided between the first and second output terminals of the bridge circuit and grounding through a switch 18, for leading out difference constant current values from the first and second output terminals of the bridge circuit.</p> |
