发明名称 MANUFACTURE OF COMPOUND SEMICONDUCTOR DEVICE
摘要 PURPOSE: To form an insulating film or a region which do not apply stress to the periphery, by a method wherein, after an insulating film is formed in a part on a semiconductor substrate, and a high resistance semiconductor layer and a low resistance semiconductor layer are laminated in the region except the insulating film, a collector layer, a base layer and an emitter layer are grown in a trench or an aperture which are formed by eliminating the insulating film. CONSTITUTION: On a semi-insulating GaAs substrate 1, an undoped GaAs buffer layer 2 of 5000Åin thickness and an N<+> GaAs subcollector layer 3 of 5000Åin thickness are formed, on which the following are formed; a high resistance GaAs layer 5 of 1000Åin thickness which has a trench or an aperture, a p<+> GaAs layer 6 of 1000Åin thickness which turns to an base outer region, and a high resistance GaAs layer 7 of 1000Åin thickness. An N-GaAs collector layer 10, P-GaAs base layer 11 and an N-AlGaAs emitter layer 12 which turn to the active region of HBT crystal are formed in the trench or the aperture. A collector electrode 13 is formed around the subcollector layer 3, and a base electrode 14 is formed around the p<+> GaAs layer 6.
申请公布号 JPH08181154(A) 申请公布日期 1996.07.12
申请号 JP19940317922 申请日期 1994.12.21
申请人 FUJITSU LTD 发明人 TOMIOKA TAKESHI
分类号 H01L29/73;H01L21/331;H01L29/205;H01L29/737;(IPC1-7):H01L21/331 主分类号 H01L29/73
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