APPARATUS FOR INSPECTION OF THREE-DIMENSIONAL SHAPE AND METHOD FOR INSPECTION BY THE SAME

摘要

An apparatus for inspecting a three-dimensional shape and an inspecting method using the same are provided to enhance reliability and accuracy of inspection by adjusting the reflectivity of each pixel. An apparatus for inspecting a three-dimensional shape comprises a light source(100), a grid pattern forming unit(110), and an imaging unit(120). The grid pattern forming unit generates a grid pattern on the surface of an object(P) to be inspected by changing the light generated from the light source. The imaging unit captures an image reflected from the surface. The three-dimensional shape of the object is measured from the captured image to detect whether the object has defects. The grid pattern forming unit includes a display control unit(111) in each pixel to form a predetermined grid pattern by controlling the brightness in each pixel according to the surface reflectivity of the object to be inspected.