发明名称 |
METHOD FOR FORMING NODE ELECTRODE OF CAPACITOR |
摘要 |
forming a gate insulating layer and a gate electrode (23); forming an impurity diffusion region (36); forming a first insulating layer (26) on the substrate ; removing the first insulating layer on one side of the gate electrode and forming bitline (27) to be connected to the impurity diffusion region; forming a second, a third, a forth insulating layer, a first conducting layer and a fifth insulating layer; forming a storage node contact hole (35); forming a second conducting layer in the storage node contact hole; etching the first conducting layer and the fifth insulating layer selectively; forming a third conducting layer, and removing the fifth and the forth insulating layer.
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申请公布号 |
KR960009113(B1) |
申请公布日期 |
1996.07.10 |
申请号 |
KR19920017520 |
申请日期 |
1992.09.25 |
申请人 |
LG SEMICONDUCTOR CO., LTD. |
发明人 |
KOO, BON - JAE;JUNG, MOON - MO |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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