发明名称 METHOD FOR FORMING NODE ELECTRODE OF CAPACITOR
摘要 forming a gate insulating layer and a gate electrode (23); forming an impurity diffusion region (36); forming a first insulating layer (26) on the substrate ; removing the first insulating layer on one side of the gate electrode and forming bitline (27) to be connected to the impurity diffusion region; forming a second, a third, a forth insulating layer, a first conducting layer and a fifth insulating layer; forming a storage node contact hole (35); forming a second conducting layer in the storage node contact hole; etching the first conducting layer and the fifth insulating layer selectively; forming a third conducting layer, and removing the fifth and the forth insulating layer.
申请公布号 KR960009113(B1) 申请公布日期 1996.07.10
申请号 KR19920017520 申请日期 1992.09.25
申请人 LG SEMICONDUCTOR CO., LTD. 发明人 KOO, BON - JAE;JUNG, MOON - MO
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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