发明名称 Capacitor and method for fabricating the same
摘要 <p>A method for making a metal-to-metal capacitor for an integrated circuit includes forming a layer of titanium/titanium nitride (14a,14b) on a polysilicon layer (12) which has been patterned with interlevel dielectrics (13). A capacitor dielectric (15) is then deposited, followed by patterning with photoresist to delineate the capacitor, etching to remove extraneous dielectric, deposition of aluminum (17), further patterning and etching to define the capacitor and access area, and removal of photoresist. <IMAGE></p>
申请公布号 EP0721223(A1) 申请公布日期 1996.07.10
申请号 EP19950308515 申请日期 1995.11.28
申请人 AT&T CORP. 发明人 RADOSEVICH, JOSEPH R.;SINGH, RANBIR
分类号 H01G4/10;H01L21/02;H01L21/822;H01L27/04;(IPC1-7):H01L29/92 主分类号 H01G4/10
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