发明名称 Layered low dielectric constant technology
摘要 A layered dielectric structure is provided, which separates a first layer of metal interconnects from each other in semiconductor devices and also separates the first layer from a second, overlying layer of metal interconnects for making electrical contact to the first layer of metal interconnects. The layered dielectric structure comprises: (a) a layer of an organic spin-on-glass material filling gaps between metal interconnects in the first layer of metal interconnects; (b) a layer of an inorganic spin-on-glass material to provide planarization to support the second layer of metal interconnects; and (c) a layer of a chemically vapor deposited oxide separating the organic spin-on-glass layer and the inorganic spin-on-glass layer. The layered dielectric structure provides capacitances on the order of 3.36 to 3.46 in the vertical direction and is about 3.2 in the horizontal direction. This is a reduction of 10 to 15% over the prior art single dielectric layer, using existing commercially available materials.
申请公布号 US5534731(A) 申请公布日期 1996.07.09
申请号 US19940330871 申请日期 1994.10.28
申请人 ADVANCED MICRO DEVICES, INCORPORATED 发明人 CHEUNG, ROBIN W.
分类号 H01L21/31;H01L21/316;H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L23/48;H01L29/06;H01L23/52;H01L29/40 主分类号 H01L21/31
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