发明名称 Method of adjusting a threshold voltage for a semiconductor device fabricated on a semiconductor on insulator substrate
摘要 A method of adjusting a threshold voltage for a semiconductor device on a semiconductor on insulator substrate includes performing a threshold voltage adjustment implant (25) after formation of a gate structure (16) to reduce the diffusion of implanted dopant (26). Reducing dopant diffusion eliminates the narrow channel effect which degrades device performance. Implanting the dopant (26) after formation of the gate structure (16) simplifies processing of semiconductor device (28) by eliminating a photolithography step which is accomplished by utilizing photoresist (21) used for a source and drain implant (22).
申请公布号 US5532175(A) 申请公布日期 1996.07.02
申请号 US19950423614 申请日期 1995.04.17
申请人 MOTOROLA, INC. 发明人 RACANELLI, MARCO;HWANG, BOR-YUAN C.;FOERSTNER, JUERGEN;HUANG, WEN-LING M.
分类号 H01L27/092;H01L21/265;H01L21/336;H01L21/8238;H01L27/00;H01L29/786;(IPC1-7):H01L21/336;H01L21/335 主分类号 H01L27/092
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