发明名称 METHOD FOR EVAULATING THERMOELECTRON EMISSION-TYPE CATHODE
摘要 PURPOSE: To accurately find the change with the lapse of time of the specified variable of a cathode and the work function after the long-hour operation by calculating the specified amount from a value of the front surface temperature measured by an optical thermometer, and reading values of current and voltage when the gradient of the voltage/current characteristics is equal to the specified amount. CONSTITUTION: The voltage Va (V) and the current Ia (mA) in the decelerating electric field state wherein an anode is electrically made negative in relation to a cathode is measured by using a diode bulb wherein an electron emitting-type cathode and an anode are parallely arranged, so as to form the voltage/current characteristics figure. A formula wherein the right of the formula to which Ia as a function of Va conventionally used as the relating formula of Va to Ia is multiplied by the current transmittance (u) is used. A value of e/(k.T) [C/J] is calculated from a value of T measured by an optical thermometer, the values of Ia and Va to be obtained when they are equal to the gradient of the characteristic figure of lm (Ia ) as a function of Va are adopted, and the accurate values of T, Ia , Va can be found. The accurate value ofβis found by using these values, and the change of the lapse of time ofβcan be accurately found.
申请公布号 JPH08171862(A) 申请公布日期 1996.07.02
申请号 JP19950170604 申请日期 1995.07.06
申请人 MATSUSHITA ELECTRON CORP 发明人 ISHII SHOJI
分类号 H01J9/42;(IPC1-7):H01J9/42 主分类号 H01J9/42
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