发明名称 Positive resist composition
摘要 Disclosed herein is a positive resist composition comprising an alkali-soluble phenolic resin and a photosensitive agent, characterized in that the positive resist composition contains, as the photosensitive agent, the quinonediazide sulfonate of at least one of phenolic compounds represented by the following general formulae (I) and (II): <IMAGE> (I) wherein R1 through R4 mean individually a hydrogen or halogen atom, a hydroxyl group, an alkyl or alkenyl group having 1-3 carbon atoms, or a hydroxyalkyl group having 1-3 carbon atoms and may be equal to or different from one another, and R5 denotes a hydrogen atom, an alkyl or alkenyl group having 1-3 carbon atoms, or an aryl group with the proviso that the number of hydroxyl groups is 3 or 4; and <IMAGE> (II) wherein R6 through R9 mean individually a hydrogen or halogen atom, an alkyl or alkenyl group having 1-3 carbon atoms, or a hydroxyalkyl group having 1-3 carbon atoms and may be equal to or different from one another, and R10 denotes a hydrogen atom, an alkyl or alkenyl group having 1-3 carbon atoms, or an aryl group with the proviso that the number of hydroxyl groups is 5 and at least one of R6 through R9 is an atom or group other than hydrogen atom. It is suitable for use in minute processing.
申请公布号 US5532107(A) 申请公布日期 1996.07.02
申请号 US19940227145 申请日期 1994.04.13
申请人 NIPPON ZEON CO., LTD. 发明人 OIE, MASAYUKI;KAWATA, SHOJI;YAMADA, TAKAMASA;IKEDA, SHINYA
分类号 G03F7/022;H01L21/027;H01L21/30;(IPC1-7):G03F7/023;C07C245/00 主分类号 G03F7/022
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