发明名称 GATE ELECTRODE FORMING METHOD
摘要 loading a wafer and injecting N2 gas into the tube of LPCVD (Low Pressure Chemical Vapor Deposition); annealing after injecting N2O gas to form a gate insulating layer; injecting SiH4 gas to form a gate electrode.
申请公布号 KR960008565(B1) 申请公布日期 1996.06.28
申请号 KR19930011750 申请日期 1993.06.25
申请人 HYUNDAI ELECTRONICS CO., LTD. 发明人 JUNG, YOUNG - SUK;PARK, INN - OK;HONG, HEUNG - KI;BAEK, DONG - WON
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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