发明名称 |
TUNGSTEN PLUG MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
The tungsten plug manufacturing method comprises the steps of depositing a barrier, which has a contact hole, on a lower conducting layer; formating a thin glue layer on a structure of a wafer including contact hole; filling the contact hole by depositing a tungsten layer on the glue layer; formating a tungsten plug with an etch back process by keep etching to the depth where the glue layer is exposed after isotropic etching of the contact hole with a SF6/Ar mixture plasma; formating a tungsten nitride layer as a protecting layer on the tungsten plug and removing remaining tungsten materials on the glue layer by isotropic etching with a SF6/Ar/N2 mixture plasma at the same time; removing the tungsten nitride layer on the tungsten plug by Ar sputtering; and formating a metal layer on the entire structure of the wafer; thereby improving the step coverage.
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申请公布号 |
KR960008555(B1) |
申请公布日期 |
1996.06.28 |
申请号 |
KR19930007367 |
申请日期 |
1993.04.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
HA, JAE - HEE |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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