发明名称 |
Security key system |
摘要 |
An aspect of the disclosure includes a security system and method having a key with nanoscale features. The key includes a body. At least one pattern member disposed on the body, the pattern member formed using a directed self-assembly polymer to define a pattern of random feature structures thereon, the feature structures having a width of less than 100 nanometers. |
申请公布号 |
US9418327(B1) |
申请公布日期 |
2016.08.16 |
申请号 |
US201615009953 |
申请日期 |
2016.01.29 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
Briggs Benjamin D.;Clevenger Lawrence A.;DeProspo Bartlet H.;Rizzolo Michael |
分类号 |
G06K19/067;G06K19/06 |
主分类号 |
G06K19/067 |
代理机构 |
Cantor Colburn LLP |
代理人 |
Cantor Colburn LLP ;Alexanian Vazken |
主权项 |
1. A key of claim for a security system comprising:
a body, the body includes a first side and a second side; at least one pattern member disposed on the body, the at least one pattern member formed using a directed self-assembly polymer formed from a first polymer and a second polymer, the first polymer and second polymer each having a different length and arranged in an alternating arrangement, the first polymer and second polymer configured to define a pattern of random feature structures thereon, the feature structures having a width of less than 100 nanometers; wherein the at least one pattern member includes a plurality of pattern members, each of the pattern members being formed using the directed self-assembly polymer to define the pattern of random feature structures thereon, each of the random feature structures being different from other random feature structures; wherein a first plurality of pattern members of the plurality of pattern members is arranged on the first side and a second plurality of pattern members of the plurality of pattern members is arranged on the second side; wherein the body includes a third side and a fourth side; and wherein the plurality of pattern members further includes a third plurality of pattern members arranged on the third side and a fourth plurality of pattern member arranged on the fourth side. |
地址 |
Armonk NY US |