首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Halbleitervorrichtung und Verfahren zu deren Herstellung
摘要
申请公布号
DE4433086(C2)
申请公布日期
1996.06.27
申请号
DE19944433086
申请日期
1994.09.16
申请人
MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP
发明人
MAEGAWA, SHIGETO, ITAMI, HYOGO, JP
分类号
H01L21/306;H01L21/336;H01L27/088;H01L29/78;H01L29/786;(IPC1-7):H01L29/786
主分类号
H01L21/306
代理机构
代理人
主权项
地址
您可能感兴趣的专利
PHARMACEUTICAL COMPOSITE FORMULATION COMPRISING HMG-COA REDUCTASE INHIBITOR AND ASPIRIN
IMPROVED PRE-FORMS FOR FLAIR APPLICATIONS
METHOD FOR PREDETERMINING THE BINDING OF A GIVEN COMPOUND TO A MEMBRANE RECEPTOR
Cable sleeve
NON-CARBOHYDRATE FOAMING COMPOSITIONS AND METHODS OF MAKING THE SAME
Device for treating a substrate web
AUTOMATED DOOR ASSEMBLY
TRAINING LADDER FORMED WITH POLYGON SEGMENTS
MICROWAVE INTEGRATED CIRCUIT PACKAGE AND MANUFACTURING METHOD THEREOF
A plumbing measurement device
Dual function cascade integrated variable area fan nozzle and thrust reverser
MANUALLY OPERATED ARRANGEMENT
WATERMARK SYSTEM
CRIMPING DIE
Portable device for the detection of concealed objects using microwaves with two polarisations perpendicular to each other
METHOD AND DEVICE FOR TRANSMITTING DATA
METHOD AND SYSTEM FOR VOLUME RENDERING COLOR MAPPING ON POLYGONAL OBJECTS
HIGH INSTALLATION PERFORMANCE BLOWN OPTICAL FIBRE UNIT, MANUFACTURING METHOD AND APPARATUS
A SYSTEM FOR MEASURING AN OPTICAL SPECTRAL RESPONSE AND/OR IV DATA OF A PHOTOELECTRIC DEVICE UNDER TEST
MATERIAL CHARACTERISTIC ESTIMATION USING INTERNAL REFLECTANCE SPECTROSCOPY
