发明名称 Transistor und Transistorherstellungsverfahren
摘要 The method comprises forming a trench in a substrate 101, introducing an insulating layer 105 into the lower portion of the trench only, introducing a conductive layer 106 into the upper portion of the trench and on the insulating layer for forming a channel of the transistor, forming a gate oxide layer 108 on the resulting structure, forming a gate electrode 109 on the gate oxide layer, and implanting impurity ions into the substrate to form source/drain regions 110. <IMAGE>
申请公布号 DE19543859(A1) 申请公布日期 1996.06.27
申请号 DE19951043859 申请日期 1995.11.24
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD., ICHON, KYOUNGKI, KR 发明人 SUH, JEUNG WON, ICHON, KYOUNGKI, KR;RHO, KWANG MYOUNG, ICHON, KYOUNGKI, KR;HWANG, SEONG MIN, ICHON, KYOUNGKI, KR
分类号 H01L21/336;H01L29/06;H01L29/10;H01L29/78;H01L29/786;(IPC1-7):H01L21/336;H01L21/308 主分类号 H01L21/336
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