摘要 |
The method comprises forming a trench in a substrate 101, introducing an insulating layer 105 into the lower portion of the trench only, introducing a conductive layer 106 into the upper portion of the trench and on the insulating layer for forming a channel of the transistor, forming a gate oxide layer 108 on the resulting structure, forming a gate electrode 109 on the gate oxide layer, and implanting impurity ions into the substrate to form source/drain regions 110. <IMAGE>
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申请人 |
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD., ICHON, KYOUNGKI, KR |
发明人 |
SUH, JEUNG WON, ICHON, KYOUNGKI, KR;RHO, KWANG MYOUNG, ICHON, KYOUNGKI, KR;HWANG, SEONG MIN, ICHON, KYOUNGKI, KR |