发明名称 Semiconductor device with thin film silicon on insulator MOSFET
摘要 The semiconductor device includes a substrate (1b) with a main surface in which is formed a buried insulation layer (2) in a position separate from the main surface. Also provided is a LOCOS insulating film (3b), a thin film transistor, and an impurity layer (15). The LOCOS film is provided in the main surface of the semiconductor substrate to insulate one active region from another active region. The thin-layer transistor is formed in the active region and it has a gate electrode (8) on one active region with an intermediate gate insulating layer (7). Also provided is a pair of source/drain layers (5) in the substrate main surface on both sides of the gate electrode, and a channel region (4). The impurity layer is formed in the substrate with a high concentration impurity and it is directly under the buried layer. Pref. the thin-layer transistor is of planar or mesa type.
申请公布号 DE19548076(A1) 申请公布日期 1996.06.27
申请号 DE19951048076 申请日期 1995.12.21
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 OASHI, TOSHIYUKI, TOKIO/TOKYO, JP;MATSUFUSA, JIRO, TOKIO/TOKYO, JP;EIMORI, TAKAHISA, TOKIO/TOKYO, JP;NISHIMURA, TADASHI, TOKIO/TOKYO, JP
分类号 H01L21/316;H01L21/02;H01L21/205;H01L21/265;H01L21/76;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L29/786;H01L21/823 主分类号 H01L21/316
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