发明名称 Method of forming a low distortion stencil mask
摘要 A stencil mask (10) has a membrane (14) under tensile stress and at least one pattern opening (22) formed through the membrane (14). A plurality of stress relief openings (30) are formed in the membrane for reducing stress-induced distortion of the membrane and the mask pattern. The stress relief openings (30) are positioned to relieve concentrations of stress within the membrane (14) such as those resulting from non-regularities within the pattern. In one embodiment, a screening material (56), less rigid than the membrane (14), is contained within the stress relief openings (30). Methods of forming such masks (10) are also disclosed.
申请公布号 US5529862(A) 申请公布日期 1996.06.25
申请号 US19930115954 申请日期 1993.09.01
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 RANDALL, JOHN N.
分类号 G03F1/16;(IPC1-7):G03F9/00 主分类号 G03F1/16
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