| 摘要 |
PURPOSE: To reduce the number of the contact termianls required for a testing jig, and at the same time, to test also the function of a logic circuit board, in the testing method for the logic circuit board where the logic circuit board is tested by composing a testing circuit by mounting the testing jig on a logic circuit board to be tested. CONSTITUTION: A logic circuit board 3A to be a tested object is composed by combining a unit function block CB1 having a function, etc. The output circuit of the unit function block is made a circuit where the interruption from a circuit is functionally possible or a 3-state buffer, for instance. As for a testing, after the output circuit BF1 and BF2 of a unit function block CBF1 outputting a signal to a unit function block to be tested CB1 are made into high impedance, a signal OSB for testing from a testing device 1A is outputted to the input terminal of the unit function block CB1 via the contact termians CI1 and CI2 of a testing jig 2A, test result signals ISB are inputted from contact terminals CO1 and CO2, and the property of the unit function block CB1 is decided from the inputted result. |
