发明名称 METHOD OF SPUTTERING SEMICONDUCTOR WAFER AND DEVICE
摘要 <p>PURPOSE: To prevent decrease of the yield of semiconductor chips by preventing peeling off of the formed thin film starting from the clip marks caused by the clips used in sputtering. CONSTITUTION: In the state a wafer S is set to a holder 10 and held by clips 15 to the holder, the holding state is temporarily released when the 50% the predetermined thickness of the a thin film formed by the sputtering on the wafer is attained, the wafer S, on which the thin film 50% of the predetermined thickness is formed, is rotated at very small angle, then the wafer S is held by the clips 15 to the holder 10 again and the sputtering is resumed to form the thin film of the thickness equivalent to the remaining thickness to the predetermined thickness.</p>
申请公布号 JPH08162410(A) 申请公布日期 1996.06.21
申请号 JP19940303698 申请日期 1994.12.07
申请人 SONY CORP 发明人 HIYAMIZU ISAMU
分类号 C23C14/34;H01L21/203;H01L21/68;H01L21/683;(IPC1-7):H01L21/203 主分类号 C23C14/34
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