发明名称 PATTERN INSPECTING APPARATUS
摘要 PURPOSE: To provide a pattern inspecting apparatus in which the pattern inspection of a repetition character array minutely printed on a printed matter can be rapidly and accurately inspected. CONSTITUTION: An image including a repetition character array minutely printed on a printed matter P is input by an image input unit 301, digitized by an A-D converter 304, and then temporarily stored in a frame memory 306. A CPU 308 operates based on a program in a program memory 309, detects the image of each unit character array of the repetition array based on the image in the memory 306, pattern matching-processes the one image of the detected each image as a reference image pattern with the residual unit character array image, and judges the pattern defect of the repetition array based on the processed result of the matching process. Then, the judged result of the defect is output by an output unit 307.
申请公布号 JPH08159985(A) 申请公布日期 1996.06.21
申请号 JP19940300824 申请日期 1994.12.05
申请人 TOSHIBA CORP 发明人 HIRASAWA TOSHITAKE
分类号 B41F33/14;G01N21/88;G01N21/89;G01N21/892;G01N21/93;G06T1/00;G06T7/00 主分类号 B41F33/14
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