发明名称 FAULT SEARCHING SYSTEM
摘要 PURPOSE: To effectively search for a fault by transmitting a test cell and analyzes an arriving cell by the cell insertion/extraction means arranged between the cell processing function parts in an ATM exchange and then setting the paths for transfer, insertion, extraction and return of those cells together with a normal cell. CONSTITUTION: A test cell production means 300 transmits a test cell via the cell insertion/extraction means 200 arranged between the cell processing function parts 100, 100 in an ATM exchange. The means 300 also compares an arriving cell with a designated one to analyze it. Each means 200 has a normal path which transfers a normal cell between the parts 100, an insertion path which inserts the test cell into the normal path, and an extraction path which extracts the transfer test cell of the normal path and sends it to the means 300. Furthermore, the means 200 has a return path which returns the cell to be transferred to one of both parts 100 to another to the transmitter side. A test path setting means 400 designates the set paths of the means 200. In such a constitution, the test cell is transferred through a test path and a fault occurring part can be searched and confirmed.
申请公布号 JPH08163134(A) 申请公布日期 1996.06.21
申请号 JP19940296303 申请日期 1994.11.30
申请人 FUJITSU LTD 发明人 MATSUKAWA TAKASHI;TANAKA HIROYUKI;FUKUDA KENJI;OHASHI MASANORI
分类号 H04Q3/00;H04L12/26;H04L12/28;(IPC1-7):H04L12/28 主分类号 H04Q3/00
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