OFFSET VOLTAGE MEASUREMENT METHOD FOR DIFFERENTIAL AMPLIFIER, MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE USING IT AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE,申请号JP19940304681-传众专利搜索

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发明名称	OFFSET VOLTAGE MEASUREMENT METHOD FOR DIFFERENTIAL AMPLIFIER, MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE USING IT AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要
申请公布号	JPH08162862(A)	申请公布日期	1996.06.21
申请号	JP19940304681	申请日期	1994.12.08
申请人	HITACHI LTD	发明人	KATO KEI;OGUCHI SATOSHI
分类号	G01R19/00;H01L21/66;H03F3/45;(IPC1-7):H03F3/45	主分类号	G01R19/00
代理机构		代理人
主权项
地址

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