OPTOELECTRONIC METHOD OF INSPECTION OF ITEM SHAPE

摘要

FIELD: measuring equipment; can be used in instrument engineering and precision mechanical engineering for inspection of item shape by optical method. SUBSTANCE: the method consists in inspection of the item shape in several preset directions with the use of radiation at a definite frequency for each direction. Transition from inspection in one direction to inspection in another one is accomplished by changing the optical frequency of radiation in combination with employment of spectral light filters selectively passing through radiation at a definite optical frequency. Connection of the transmitting and receiving light guides makes up a "spatial optical gauge", whose surface is similar to the surface of the item under inspection and opposite to it. This provides for information in several directions. EFFECT: simplified measuring means for inspection of item shape and expanded functional potentiabilities. 3 cl, 1 dwg