| 发明名称 |
METHOD AND APPARATUS OF DETECTING DEFECTS |
| 摘要 |
PURPOSE:To detect the presence or not of defects from the change in the color of a defect detecting material which discolors upon receiving of radiations by cleaning the surface of the face to be put in contact with a radioactive object thereafter applying said material on the surface. |
| 申请公布号 |
JPS53117494(A) |
申请公布日期 |
1978.10.13 |
| 申请号 |
JP19770031597 |
申请日期 |
1977.03.24 |
| 申请人 |
TOKYO SHIBAURA ELECTRIC CO;NIPPON ATOMIC IND GROUP CO;TOKUSHU TORYO KK |
发明人 |
ISHII RIYOUICHI;ISHIKAWA FUKUSABUROU;SAKURAI YOSHISHIGE;KURIHARA TADASHI;NAGASHIMA TAKEUEMON |
| 分类号 |
G01N23/18;G01N21/91;G01N23/04;G01T1/16 |
主分类号 |
G01N23/18 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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