Vorrichtung zur Prüfung transparenter und/oder einseitig optisch undurchsichtig beschichteter Objekte auf Materialfehler

摘要

A device for checking transparent and/or semi-transparent objects (6), such as flat glass and/or plastic articles, for scratches, impurities or similar material defects essentially consists of a punctual light source (1), an optic (3) that widens the light into a beam with a homogeneous profile, and a ground-glass screen (7) that makes it possible to picture any material defects that may be present in the object (6). The optic (3) is designed to project co-linear to slightly diverging light onto the object (6), so that only contrasting factors that are caused by a change in the index of refraction of the material are pictured. The punctual light source (1) may be a white light source or a laser light source. It may be desirable for the measurement device that monochromatic light be projected onto the object.