发明名称 Process for forming thin films by plasma CVD for use in the production of semiconductor devices
摘要 A silicon oxide film is formed by a CVD process, with the use of a silane group gas and water as a main feed gas. Further, a film including silanol is formed by the plasma CVD process with a specific plasma energy, using the silane group gas and water as the main feed gas. The specific plasma energy is selected at 40 (Wx DEG C./cm2) or below. By annealing this film including silanol, or by performing the oxygen plasma process or the ammonia plasma process, the oxide film or the nitride film is formed.
申请公布号 US5525550(A) 申请公布日期 1996.06.11
申请号 US19930154538 申请日期 1993.11.19
申请人 FUJITSU LIMITED 发明人 KATO, TAKASHI
分类号 C23C16/40;C23C16/56;H01L21/3105;H01L21/314;H01L21/316;H01L21/318;(IPC1-7):H01L21/316 主分类号 C23C16/40
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