发明名称 |
PRODUCTION OF PHASE-SHIFT MASK AND SPUTTERING DEVICE |
摘要 |
PURPOSE: To easily form a charge-up preventive film at the time of forming a phase-shifter pattern without increasing the number of processes and to easily release the preventive film with good selectivity without increasing the number of process. CONSTITUTION: An attenuation-shifter film 2 consisting of a chromium-based material contg. at least oxygen or nitrogen and a chromium film 3 are successively formed on a transparent substrate 1. An electron-beam resist 4 is then applied on the chromium film 3, and the resist 4 is patterened. The resist 4 is then developed to form a resist pattern. The chromium film 3 and the attenuation-shifter film 2 are etched in one step with the resist patterns as a mask to form an attenuation-shifter pattern, and then the resist pattern and chromium film 3 are removed. |
申请公布号 |
JPH08152706(A) |
申请公布日期 |
1996.06.11 |
申请号 |
JP19940296234 |
申请日期 |
1994.11.30 |
申请人 |
FUJITSU LTD |
发明人 |
ISHIWATARI NAOYUKI;HASEGAWA HIDEAKI;NOCHIDA KOJI |
分类号 |
C23C14/34;C23C14/35;C23F1/00;G03F1/32;G03F1/40;G03F1/68;G03F1/80;H01L21/203 |
主分类号 |
C23C14/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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