| 摘要 |
PURPOSE: To reduce vibration propagated to a sample and thereby to enable highly-accurate measurement of X-ray reflectance relating to a liquid sample, in particular, in θ-θ scanning X-ray equipment of a type wherein both of an X-ray source and an X-ray counter are rotated around the sample. CONSTITUTION: θ-θ scanning X-ray equipment having a sample support stand 13 whereon a sample Sa is set, an X-ray source S which moves in rotation by θs around the sample Sa on the sample support stand 13 and an X-ray counter 3 which moves in rotation by θd around the sample Sa . A gonio-frame 5 supporting the X-ray source S and the X-ray counter 3 and the sample support stand 13 and installed separately and independently on a floor 11. By this structure of separate and independent installation, the vibration of the gonioframe 5 caused by the θs rotation, the θd rotation, etc., is prevented from being propagated to the sample Sa . |
