发明名称 VOLTAGE LEVEL SHIFT CIRCUIT
摘要 <p>PURPOSE: To obtain the circuit with high reliability in which a gate oxide film is not destroyed by connecting a load element, a one conduction type of a 1st MOS transistor(TR) and reverse conduction type of 2nd and 3rd MOS TRs in series between a power supply and ground in this order and introducing a logical output from a connecting point between the 1st and 2nd MOS TRs. CONSTITUTION: A resistive element R11 acting like a load element L11 , a P channel MOS TR P12 receiving a voltage VMP close to a voltage VPP/2 at its gate, an N channel MOS TR N12 whose gate receives a voltage VMN close to VPP/2 and an N channel MOS TR N11 whose gate receives an input signal IN1 are connected in series between a high voltage power supply terminal VPP and a GND. Then the inverse of output signal OUT11 is extracted from the connecting point between the MOS TRs P12 , N12 . Thus, a high voltage is controlled by the input signal IN11 deflected between the VDD and GND to obtain the inverse of output signal OUT11 .</p>
申请公布号 JPH08148988(A) 申请公布日期 1996.06.07
申请号 JP19950240385 申请日期 1995.09.20
申请人 NEC CORP 发明人 OBATA HIROYUKI
分类号 G11C17/00;G11C16/06;H03K19/0185;(IPC1-7):H03K19/018 主分类号 G11C17/00
代理机构 代理人
主权项
地址