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发明名称
TEST PATTERN DEVICE FOR SEMICONDUCTOR IC TEST DEVICE
摘要
申请公布号
JPH08146102(A)
申请公布日期
1996.06.07
申请号
JP19940306781
申请日期
1994.11.16
申请人
ADVANTEST CORP
发明人
FURUKAWA YASUO
分类号
G01R31/3183;(IPC1-7):G01R31/318
主分类号
G01R31/3183
代理机构
代理人
主权项
地址
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