PROTECTOR AND STOCKING METHOD OF PROBE CARD FOR MEASURING SEMICONDUCTOR,申请号JP19940307032-传众专利搜索

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发明名称	PROTECTOR AND STOCKING METHOD OF PROBE CARD FOR MEASURING SEMICONDUCTOR
摘要
申请公布号	JPH08148535(A)	申请公布日期	1996.06.07
申请号	JP19940307032	申请日期	1994.11.15
申请人	SONY CORP	发明人	NAGASAKI KENICHI
分类号	G01R1/06;H01L21/66;(IPC1-7):H01L21/66	主分类号	G01R1/06
代理机构		代理人
主权项
地址

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