发明名称 SUPERSONIC EXAMINATION SYSTEMS
摘要 The system improves the resolution by dynamically varying the effective range of a sensor and aggregating the supersonic signal reflected from the object. Sensor contains several lattice converters(10) and they receive supersonic signal cluster reflected from the object. Amplifiers(AMP1~AMPk) amplifies the output signal from the lattice converters. Lattice converters(10) varies the effective range of the sensor by the depths of the reflected supersonic signal cluster. Sampling switches(SW1~SWn) performs sampling from the amplified signal cluster and the samples are stored in buffers(BUF1~BUFn). Selection switches(SW1`~SWn`) selectively transmit the output signal from the buffer. Adding device(20) adds the signals from the selection switches and generates the aggregated signal.
申请公布号 KR960007549(B1) 申请公布日期 1996.06.05
申请号 KR19920024366 申请日期 1992.12.15
申请人 MEDISON CO., LTD. 发明人 LEE, SEUNG - WOO
分类号 A61B8/00;(IPC1-7):A61B8/00 主分类号 A61B8/00
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