发明名称 Probes for scanning SQUID magnetometers
摘要 Improved probes for miniaturized scanning magnetometers (scanning microscopes), particularly those utilizing superconducting quantum interference devices (SQUIDs), are provided by the invention. The improved probes can have sub- mu m2 effective pickup loop areas and enhanced shielding through the use of progressively wider double groundplane structures which result in improved probes having high spatial resolution.
申请公布号 US5523686(A) 申请公布日期 1996.06.04
申请号 US19940298242 申请日期 1994.08.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 KIRTLEY, JOHN R.;KETCHEN, MARK B.
分类号 G01Q70/00;G01N37/00;G01R33/035;H01L39/22;(IPC1-7):G01R33/035;G01R33/16 主分类号 G01Q70/00
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