发明名称 |
Probes for scanning SQUID magnetometers |
摘要 |
Improved probes for miniaturized scanning magnetometers (scanning microscopes), particularly those utilizing superconducting quantum interference devices (SQUIDs), are provided by the invention. The improved probes can have sub- mu m2 effective pickup loop areas and enhanced shielding through the use of progressively wider double groundplane structures which result in improved probes having high spatial resolution.
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申请公布号 |
US5523686(A) |
申请公布日期 |
1996.06.04 |
申请号 |
US19940298242 |
申请日期 |
1994.08.30 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
KIRTLEY, JOHN R.;KETCHEN, MARK B. |
分类号 |
G01Q70/00;G01N37/00;G01R33/035;H01L39/22;(IPC1-7):G01R33/035;G01R33/16 |
主分类号 |
G01Q70/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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