SHOCK DESTRUCTIVE TEST METHOD AND DEVICE,申请号JP19940303067-传众专利搜索

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发明名称	SHOCK DESTRUCTIVE TEST METHOD AND DEVICE
摘要
申请公布号	JPH08136429(A)	申请公布日期	1996.05.31
申请号	JP19940303067	申请日期	1994.11.11
申请人	NEC CORP	发明人	YOSHIDA MEGUMI
分类号	G01N3/00;G01N3/30;G01N3/303;(IPC1-7):G01N3/30	主分类号	G01N3/00
代理机构		代理人
主权项
地址

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