发明名称 DEFECT INSPECTION METHOD AND APPARATUS THEREFOR
摘要 PURPOSE: To prevent the occurrence of erroneous detection due to radiation of illuminating light for inspection at the time when defect inspection is automated by applying an image processing technology. CONSTITUTION: A defect inspection apparatus 1 is an apparatus provided with a light radiating means to radiate illuminating light to a resin pellet of an inspection part 5, a color CCD camera 7 to take an image of the pellet on the inspection part 5, an image processing means to carry out a prescribed image processing for the image taken by the camera, and a defect detecting means to detect the defect of the pellet based on the results of the image processing and the pellet is an opaque pellet. A pellet sending apparatus 2 to send a group of pellets on the inspection part 5 while arranging the pellets on the a conveying route and preventing them from overlapping mutually is also installed and at the same time the bottom part of the inspection part is made of a transparent glass plate 42 and the light radiating means is provided with an upper side illuminating lamp 6 to radiate illuminating light to the pellets from the upper side and a lower side illuminating lamp to radiate illuminating light to the pellets from the lower side of the transparent glass plate.
申请公布号 JPH08136467(A) 申请公布日期 1996.05.31
申请号 JP19940274983 申请日期 1994.11.09
申请人 KURABO IND LTD 发明人 NUMATA SEIICHI;KIRI HIROYASU;TAMURA SHOJI
分类号 G01B11/30;G01N21/88;G01N21/93;G01N21/94;G06T1/00;G06T7/00 主分类号 G01B11/30
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