发明名称 |
Waveform display apparatus for easily realizing high-definition waveform observation |
摘要 |
A measurement unit U100 measures an input signal to be measured by sweeping frequencies in a measurement range having a predetermined frequency band so as to obtain waveform data to be developed on the frequency axis such as spectrum data in, e.g., a spectrum analyzer. The waveform data obtained by the measurement of the measurement unit U100 is displayed by a display device 500 via a display data processor U20 included in a control unit U200 to be described later to be developed on the frequency axis of the display device, i.e., in correspondence with the measurement frequencies. The control unit U200 includes a measurement controller U30 for controlling the measurement unit U100 so as to display waveform data obtained by enlarging or reducing waveform data, before a measurement frequency condition is changed, at a predetermined magnification to have a predetermined point on the frequency axis as the center on the basis of a change in measurement frequency condition set by a condition setting unit U900, and an enlargement display/stable display processor U40 for controlling the display data processor U20. The enlargement display/stable display processor U40 realizes high-definition waveform observation as the gist of this invention, and substantially has a function of controlling the display device U500 as the control unit U200.
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申请公布号 |
US5519820(A) |
申请公布日期 |
1996.05.21 |
申请号 |
US19950385555 |
申请日期 |
1995.02.08 |
申请人 |
ANRITSU CORPORATION |
发明人 |
KAWAUCHI, TAKEHIKO;IMAZU, YOSHIFUMI;KAMIYAMA, KATSUHIKO;TAKANO, MITSUYOSHI;IIYOSHI, KATSUHISA;WADA, TAKAHIRO;KATAYAMA, AIICHI |
分类号 |
G01R13/34;G01R23/16;G01R23/163;G01R23/173;G01R27/32;(IPC1-7):G06T3/00 |
主分类号 |
G01R13/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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