| 摘要 |
A Channel Accelerated Carrier Tunneling method of programming high speed, low voltage, memory cells, typically non-volatile memory cells, using the majority carriers available in an MOS channel is disclosed. The method uses the velocity of the majority carriers in the channel, the kinetic energy available, to enhance the accelerating voltage applied towards a storage electrode to enhance the collection and storage of the carriers by the storage electrode, typically a floating gate in a non-volatile memory. The method envisages a discontinuity in the channel which allows the carriers to be accelerated towards it. By having a storage electrode with voltage gradient, over lying the discontinuity, in the direction of acceleration of the carriers, these carriers can be made to pass through the oxide barrier of the gate and accumulate on the storage node. The use of the acceleration of the carriers allow the additional applied field requirement, to cause tunneling, to be lower and hence the voltages applied to the control gate can be lower in value. In addition the availability of the large population of majority carriers in the channel under operating conditions of voltage and current, having the correct directional velocity component, allows the memory to be written at high speeds. The large number of channel majority carriers also allow the use of lower junction voltages in the device, as no additional carrier generation by alternate methods, like impact ionization, is needed. This in effect allows the manufacture of high speed, low voltage memory cells for applications in high density memories. The use of low fields and low voltages also tend to enhance the reliability of the cells by reducing the stresses on the device elements.
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