发明名称 DEVICE FOR MEASUREMENT OF COMPLEX REFLECTION FACTOR
摘要 FIELD: radio measurement technology; measurement of parameters of materials in centimeter, millimetric and submillimetric wave bands. SUBSTANCE: quasi-optical line on base of metal-dielectric wave-guides includes SHF oscillator, directional coupler, working mode converters in form of smooth pyramidal horn with two metal plates adjoining larger base which are parallel to axis and have galvanic contact with wider walls of horn, four-arm rectangular splitter of square waveguides with directional power divider made in form of dielectric plate shifted relative to diagonal plane. SHF oscillator is connected via directional coupler and first working mode converter to first arm of waveguide splitter; second arm of waveguide splitter which is opposite to first one is provided with devices for connecting the specimen under test. Third lateral arm which is adjacent to first one is located on one side from directional power divider; fourth arm is connected, via second working mode converter, to first detector section whose output is connected to first input of indicator unit; output of second detector section is connected to its second input; input of second detector section is connected to output of secondary waveguide of directional coupler. provision is made for polarized measurements; description contains data on construction of individual units and results of measurements. EFFECT: minimization of interference factors which is necessary for measurement of very small reflection factors: up to 50-60 dB. 6 cl, 7 dwg
申请公布号 RU94026120(A) 申请公布日期 1996.05.20
申请号 RU19940026120 申请日期 1994.07.14
申请人 APLETALIN V.N.;ZUBKOV A.S.;KAZANTSEV JU.N.;SOLOSIN V.S. 发明人 APLETALIN V.N.;ZUBKOV A.S.;KAZANTSEV JU.N.;SOLOSIN V.S.
分类号 G01R27/06 主分类号 G01R27/06
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