| 摘要 |
PURPOSE: To provide an EXAFS measuring device with simple structure at extremely low manufacturing cost. CONSTITUTION: This EXAFS measuring device has an X-ray source 1 for generating an X-ray; a spectral crystal 3 for making the spectral diffraction of the X-ray emitted from the X-ray source 2; a detector unit 20 having I0 detector 5 and I detector 7 for detecting the spectrally diffracted X-ray and a sample 6; and a goniometer 15 for measuring the rotating angles of the spectral crystal 3 and the detector unit 20. The goniometer 15 is formed of a so-called goniometer of θ-2θ series for θ-rotating the spectral crystal 3 and also 2θ-rotating the detector unit 20 with the crystal axis ω of the spectral crystal 3 as the center at double speed. |
