发明名称 PHASE SHIFT MASK
摘要 PURPOSE: To make it possible to execute patterning without an increase of working stages, disconnection of patterns in the boundary regions between non-phase shift regions and phase shift regions and formation of unnecessary patterns. CONSTITUTION: This phase shift mask is formed with exposure patterns by light shielding films 9 on a transparent substrate 1 and has the regions 8 where transmitted light is phase shifted by phase shifters 2 and the regions 9 where the transmitted light is not phase shifted in the light transmission regions not covered with the light shielding films 9. The phase shift mask has rectangular projecting parts 4 of a width below the resolution threshold of an exposure device to be to be used and a length above the resolution threshold at the ends of the phase shifters 2.
申请公布号 JPH08123009(A) 申请公布日期 1996.05.17
申请号 JP19940260069 申请日期 1994.10.25
申请人 SHARP CORP 发明人 TANIGUCHI NORIYUKI;TABUCHI HIROKI
分类号 G03F1/30;G03F1/68;H01L21/027 主分类号 G03F1/30
代理机构 代理人
主权项
地址