发明名称 METHOD FOR FORMING EXTREMELY FINE PATTERN OF COMPOUND SEMICONDUCTOR
摘要 PURPOSE: To provide a method for readily obtaining an epitaxial growth layer with excellent reproducibility and a flat surface, and provide a method for forming a fine pattern having a wire width of 50nm or less. CONSTITUTION: On a GaAs substrate 10 having a surface slightly inclined only at a specific angle from a (001) crystalline surface, a compound semiconductor 11 is formed. The surface comes into contact with oxygen gas and a light is emitted to form an optical oxide film 12. Etching gas 13 such as chlorine gas or the like is emitted while electronic beams 14 are scanned, so that the oxide film 12 in a specific region is removed. Only the etching gas 13 is emitted and an exposure part of the compound semiconductor 11 is etched with the use of the oxide film 12 as an etching mask.
申请公布号 JPH08124884(A) 申请公布日期 1996.05.17
申请号 JP19950099925 申请日期 1995.03.31
申请人 HIKARI GIJUTSU KENKYU KAIHATSU KK 发明人 ISHIKAWA TOMONORI;TANAKA NOBUYUKI;ROPESU ROPESU MAKISHIMO;MATSUYAMA ISAMU
分类号 H01L21/302;H01L21/3065;(IPC1-7):H01L21/302;H01L21/306 主分类号 H01L21/302
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