发明名称 |
VAPOR GROWTH METHOD AND DEVICE |
摘要 |
PURPOSE: To obtain a thin film which is prescribed in thickness and resistivity distribution when it is formed on the surface of a substrate by the use of a horizontal vapor growth device by a method wherein a mixed gas close to the surface of the substrate is properly controlled in the concentration distribution of component gases and dopant in the crosswise direction of a reaction chamber. CONSTITUTION: Lower gas inlets 18 (inlet for material gas 31) are arranged in parallel in the crosswise direction of the reaction vessel 1 on a lower side of a point which is located down the upper gas feed inlet 13 (inlet for carrier gas 32) of a reaction vessel 1 by a prescribed distance L (cm) and where the eddy 34 of carrier gas 32 is generated. The distance L is set equal to or preferably larger than the sum of H (cm)×1.8+1.0cm. The lower gas inlets 18 are properly controlled in flow rate or concentration of material gas respectively. |
申请公布号 |
JPH08124859(A) |
申请公布日期 |
1996.05.17 |
申请号 |
JP19940284234 |
申请日期 |
1994.10.25 |
申请人 |
SHIN ETSU HANDOTAI CO LTD |
发明人 |
HABUKA HITOSHI;MAYUZUMI MASANORI;TATE NAOTO;KATAYAMA MASAYASU |
分类号 |
H01L21/205;C23C16/44;C23C16/455;C30B25/14;(IPC1-7):H01L21/205 |
主分类号 |
H01L21/205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|