发明名称 |
SEMICONDUCTOR DEVICE AND FABRICATION THEREOF |
摘要 |
<p>PURPOSE: To realize a semiconductor device in which short circuit can be suppressed while restraining increase of occupation area and misalignment does not cause fluctuation in the interelectrode capacitance. CONSTITUTION: A thin film layer 5 having a recess 5b superposed on a first electrode 2 and a part of a second electrode 9 and a protrusion 5a superposed on the first electrode 2 is formed such that the planar profile is symmetric with respect to the center lines of the protrusion 5a and the recess 5b and the thin film layer 5 is present at least at a twisted intersection of the edge of first electrode 2 in the direction perpendicular to the longitudinal direction thereof and the second electrode 9. The second electrode 9 has a protrusion 9c superposed on the first electrode 2 and a part of the protrusion 5a of the thin film layer 5 wherein the lateral length projecting from the protrusion 5a of the thin film layer 5 is equal to the lateral length of the recess 5b in the thin film layer 5. A third electrode 10 is formed to intersect the first electrode 2, while being twisted, at the protrusion 5a of the thin film layer 5.</p> |
申请公布号 |
JPH08125189(A) |
申请公布日期 |
1996.05.17 |
申请号 |
JP19940262786 |
申请日期 |
1994.10.26 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
HIROSE TAKASHI;TAMURA TATSUHIKO |
分类号 |
G02F1/136;G02F1/1368;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
G02F1/136 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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