| 摘要 |
The platform is designed to allow two simultaneous observations on the same sample (18). From beneath, a spectroscopic measurement is carried out by total internal reflection, carried out using an inverse optical microscope. From above a further measurement is carried out using a microscope which may be one of several different types: AFM (atomic force microscope), STM (scanning tunnelling microscope), PSTM (photon scanning tunnelling microscope) or RSM (reflection scanning microscope).The sample is supported on a prism (15) which is hemi-cylindrical, with its axis coincident with the axis (12) of a light source (8) connected to the input of the platform (1), whilst the sample lies on the plane surface (17) of the prism. |
