发明名称 |
MOS FIELD EFFECT TRANSISTOR MANUFACTURING PROCESS |
摘要 |
forming an insulation layer locally on a semiconductor substrate; depositing polycrystal silicon over the resulting structure; recrystallizing polycrystal silicon to single crystal silicon to use the substrate to seed region; keeping source/drain on the insulation layer and single crystal silicon on a channel region by selective etching the single crystal silicon; forming a gate oxide film on the single crystal silicon of the channel region; and forming a gate electrode on the gate oxide film. The process can reduce source/drain area and realize higher integration of element.
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申请公布号 |
KR960006105(B1) |
申请公布日期 |
1996.05.08 |
申请号 |
KR19930001897 |
申请日期 |
1993.02.12 |
申请人 |
LG SEMICONDUCTOR CO., LTD. |
发明人 |
PARK, KONG - HEE;YUN, HYUN - DO |
分类号 |
H01L27/08;H01L29/78;(IPC1-7):H01L27/08 |
主分类号 |
H01L27/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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