发明名称 MOS FIELD EFFECT TRANSISTOR MANUFACTURING PROCESS
摘要 forming an insulation layer locally on a semiconductor substrate; depositing polycrystal silicon over the resulting structure; recrystallizing polycrystal silicon to single crystal silicon to use the substrate to seed region; keeping source/drain on the insulation layer and single crystal silicon on a channel region by selective etching the single crystal silicon; forming a gate oxide film on the single crystal silicon of the channel region; and forming a gate electrode on the gate oxide film. The process can reduce source/drain area and realize higher integration of element.
申请公布号 KR960006105(B1) 申请公布日期 1996.05.08
申请号 KR19930001897 申请日期 1993.02.12
申请人 LG SEMICONDUCTOR CO., LTD. 发明人 PARK, KONG - HEE;YUN, HYUN - DO
分类号 H01L27/08;H01L29/78;(IPC1-7):H01L27/08 主分类号 H01L27/08
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