发明名称 Semiconductor device having MOS transistor
摘要 A semiconductor device which can effectively prevent impurity diffusion in heat treatment for electrically activating the impurity, and a manufacturing method thereof are disclosed. In the semiconductor device, a diffusion preventing layer having a depth equal to or greater than a junction depth of source/drain regions is formed along the entire junction region of the source/drain regions. The diffusion preventing layer is formed near the surface at the side of a gate insulation layer of the gate electrode including impurity.
申请公布号 US5514902(A) 申请公布日期 1996.05.07
申请号 US19940310513 申请日期 1994.09.22
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KAWASAKI, YOUJI;TAKAHASHI, TAKETO;MURAKAMI, TAKASHI
分类号 H01L21/265;H01L21/28;H01L21/336;H01L21/8238;H01L27/092;H01L29/08;H01L29/10;H01L29/167;H01L29/49;(IPC1-7):H01L29/167;H01L29/207;H01L29/227 主分类号 H01L21/265
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