发明名称 Method of producing PN junction device
摘要 A PN junction device is formed by removing an inert film from a surface of an N type semiconductor layer to expose an active face, then applying a source gas containing an P type impurity component to the active face to form an impurity adsorption film, and thereafter carrying out a solid-phase diffusion of the impurity is carried out from a diffusion source composed of the P type impurity adsorption film into the N type semiconductor layer to form therein a P type semiconductor layer to thereby provide a PN junction. Lastly, a pair of electrodes are connected to the respective semiconductor layers to form the an PN junction device.
申请公布号 US5514620(A) 申请公布日期 1996.05.07
申请号 US19940210769 申请日期 1994.03.21
申请人 SEIKO INSTRUMENTS INC. 发明人 AOKI, KENJI;AKAMINE, TADAO;SAITO, NAOTO
分类号 H01L21/225;H01L21/329;H01L21/822;H01L27/04;H01L29/861;H01L29/866;H01L29/88;H01L29/93;H01L31/0248;H01L31/103;H01L31/18;(IPC1-7):H01L21/225 主分类号 H01L21/225
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