Function testing apparatus for integrated circuit

摘要

The function test apparatus includes a test-standard appropriate to the applications of the circuit to be tested (16) against which the output of the circuit can be measured. A semiconductor chip (14) is provided which can programmed to at least one part of this test-standard and is linked through a contact element (15) with the circuit. This arrangement tests the circuit directly when electrical contact is made. Wafers may be used instead of chips. The contact element is made from a piezoelectric conductive rubber.