Integrated circuit driver inhibit control method for test

摘要

A method and apparatus for designing very large scale integrated circuit devices, most particularly level sensitive scan design (LSSD) devices, by inclusion of a plurality of distributed delay lines (110, 112) originating at input terminals of the device, and controlling the inhibiting and enabling of driver circuits connected to the output terminals of the device, as required to regulate operation of device drivers during a plurality of testing operations.