| 摘要 |
PURPOSE: To provide a radiation spectroscope wherein, even if secondary radiation generated from a sample is long wavelength, intensity of the secondary radiation which is made incident on a radiation detector is enough, so that, accurate analysis is possible. CONSTITUTION: Multiple spectral elements 7 and 8, spacing of lattice planes different each other, which are assigned parallel to each other on the pathes of secondary radiation 5 and 6 generated by a sample 3 irradiated with primary radiation 2 from a radiation source 1, are provided, and, these spectral elements 7 and 8 are so set as to diffract the secondary radiation 14 and 15 of the same wave length, for them to enter into a single radiation detector 10. |
